Informaçao sobre o Autor
Жигунов, Д. В.
| Edição | Seção | Título | Arquivo |
| Nº 11 (2024) | Articles | Atomistic Simulation of Segregation in Ternary Pt–Pd–Ni Nanoalloy |
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Palavras-chave
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
compact neutron source
density functional theory
electron microscopy
electronic structure
ion implantation
irradiation
magnetron sputtering
microstructure
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
zinc oxide
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Usuário
Assinatura
Entrar no sistema para verificar sua assinatura
Palavras-chave
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
compact neutron source
density functional theory
electron microscopy
electronic structure
ion implantation
irradiation
magnetron sputtering
microstructure
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
zinc oxide
Informações